Gevorgyan, S.G. et al. 2010. METHOD FOR MEASURING THICKNESS OF THIN OBJECTS WITH A NANOMETER RESOLUTION, BASED ON THE SINGLE-LAYER FLAT-COIL-OSCILLATOR METHOD. Proceedings of the YSU A: Physical and Mathematical Sciences. 44, 3 (223) (Oct. 2010), 63–67. DOI:https://doi.org/10.46991/PYSU:A/2010.44.3.063.