GEVORGYAN, S. G.; MURADYAN, S. T.; AZARYAN, M. H.; KARAPETYAN, G. H. METHOD FOR MEASURING THICKNESS OF THIN OBJECTS WITH A NANOMETER RESOLUTION, BASED ON THE SINGLE-LAYER FLAT-COIL-OSCILLATOR METHOD. Proceedings of the YSU A: Physical and Mathematical Sciences, Yerevan, Armenia, v. 44, n. 3 (223), p. 63–67, 2010. DOI: 10.46991/PYSU:A/2010.44.3.063. Disponível em: https://journals.ysu.am/index.php/proceedings-phys-math/article/view/vol44_no3_2010_pp063-067. Acesso em: 3 jul. 2024.