IMAGE CONTRAST FORMED BY SCATTERED X-RAYS

Authors

  • K.T. Avetyan Chair of Solid State Physics, YSU, Armenia
  • L.V. Levonyan Chair of Solid State Physics, YSU, Armenia
  • H.S. Semerjyan Chair of Solid State Physics, YSU, Armenia
  • M.M. Arakelyan Chair of Solid State Physics, YSU, Armenia

DOI:

https://doi.org/10.46991/PSYU:A/2014.48.3.049

Keywords:

X-ray radiation, scattering contrast, invisible defects

Abstract

is experimentally established that, in the majority of cases, the X-ray radiation scattered on different constituent parts of a weakly absorbing object provides sufficient information on inner structure, different types of structural inhomogeneities and morphological characteristics, such as shapes, sizes and location of invisible defects of the object. In this study a new method, based on recording of the scattered X-ray radiation, for investigation of the inner structure of noncrystalline materials is developed. It is demonstrated that the image contrast, formed by the X-ray radiation scattered on weakly absorbing objects, can be considerably higher than the absorption contrast.

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Published

2014-11-03

How to Cite

Avetyan, K., Levonyan, L., Semerjyan, H., & Arakelyan, M. (2014). IMAGE CONTRAST FORMED BY SCATTERED X-RAYS. Proceedings of the YSU A: Physical and Mathematical Sciences, 48(3 (235), 49–55. https://doi.org/10.46991/PSYU:A/2014.48.3.049

Issue

Section

Physics