VISUALIZATION OF STRESS FIELDS IN MONOCRYSTALS BY THE JOINT APPLICATION OF X-RAY PENDELLOSUNG FRINGES AND MOIR PATTERNS METHODS

K. V. Aloumyan; T. H. Eyramjyan

doi:10.46991/PYSU:A/2005.39.1.136

VISUALIZATION OF STRESS FIELDS IN MONOCRYSTALS BY THE JOINT APPLICATION OF X-RAY PENDELLOSUNG FRINGES AND MOIR PATTERNS METHODS

Authors

K. V. Aloumyan Chair of Solid State Physics, YSU, Armenia
T. H. Eyramjyan Chair of Solid State Physics, YSU, Armenia

DOI:

https://doi.org/10.46991/PYSU:A/2005.39.1.136

Keywords:

visualization of the isostrain lines, dislocation Si monocrystals, X-ray Moire and Pendellosung Fringes methods

Abstract

In the paper the results of visualization of the isostrain lines for local regions of dislocation Si monocrystals by joint application of X-ray Moire and Pendellosung Fringes methods are presented.

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Published

2005-02-28

How to Cite

Aloumyan, K. V., & Eyramjyan, T. H. (2005). VISUALIZATION OF STRESS FIELDS IN MONOCRYSTALS BY THE JOINT APPLICATION OF X-RAY PENDELLOSUNG FRINGES AND MOIR PATTERNS METHODS. Proceedings of the YSU A: Physical and Mathematical Sciences, 39(1 (206), 136–138. https://doi.org/10.46991/PYSU:A/2005.39.1.136